Package structure and method of manufacturing the same

ABSTRACT

A package structure and a method of manufacturing the same are provided. The package structure includes a die, an encapsulant, a first redistribution line (RDL) structure, a second RDL structure, a conductive terminal, and a through via. The encapsulant laterally encapsulates the die. The first redistribution line (RDL) structure on a first side of the die and the encapsulant, wherein the first RDL structure comprises a dielectric layer and a redistribution layer in the dielectric layer. The second RDL structure is located on a second side of the die and the encapsulant. The conductive terminal is connected to the redistribution layer. The through via extends through the encapsulant and the redistribution layer to contact the conductive terminal and the second RDL structure.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation application of and claims the priority benefit of a prior application Ser. No. 16/714,801, filed on Dec. 16, 2019, now allowed. The prior application Ser. No. 16/714,801 is a continuation application of and claims the priority benefit of U.S. application Ser. No. 15/706,783, filed on Sep. 18, 2017, now allowed. The entirety of the above-mentioned patent application is hereby incorporated by reference herein and made a part of this specification.

BACKGROUND

The semiconductor industry has experienced rapid growth due to continuous improvements in the integration density of various electronic components (i.e., transistors, diodes, resistors, capacitors, etc.). For the most part, this improvement in integration density has come from continuous reductions in minimum feature size, which allows more of the smaller components to be integrated into a given area. These smaller electronic components also require smaller packages that utilize less area than previous packages. Some smaller types of packages for semiconductor components include quad flat packages (QFPs), pin grid array (PGA) packages, ball grid array (BGA) packages, and so on.

Currently, integrated fan-out packages are becoming increasingly popular for their compactness.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A to FIG. 1L are schematic cross-sectional views illustrating a method of forming a package structure according to a first embodiment of the disclosure.

FIG. 2A to FIG. 2C are schematic cross-sectional views illustrating a method of forming a package structure according to a second embodiment of the disclosure.

FIG. 3A to FIG. 3F are schematic cross-sectional views illustrating a method of forming a package structure according to some embodiments of the disclosure.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, or examples, for implementing different features of the provided subject matter. Specific examples of components and arrangements are described below to simplify the present disclosure. These are, of course, merely examples and are not intended to be limiting. For example, the formation of a second feature over or on a first feature in the description that follows may include embodiments in which the second and first features are formed in direct contact, and may also include embodiments in which additional features may be formed between the second and first features, such that the second and first features may not be in direct contact. In addition, the present disclosure may repeat reference numerals and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath”, “below”, “lower”, “on”, “above”, “upper” and the like, may be used herein for ease of description to describe one element or feature's relationship to another element(s) or feature(s) as illustrated in the FIG.s. The spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the FIG.s. The apparatus may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein may likewise be interpreted accordingly.

Other features and processes may also be included. For example, testing structures may be included to aid in the verification testing of the 3D packaging or 3DIC devices. The testing structures may include, for example, test pads formed in a redistribution layer or on a substrate that allows the testing of the 3D packaging or 3DIC, the use of probes and/or probe cards, and the like. The verification testing may be performed on intermediate structures as well as the final structure. Additionally, the structures and methods disclosed herein may be used in conjunction with testing methodologies that incorporate intermediate verification of known good dies to increase the yield and decrease costs.

FIGS. 1A to 1L are schematic cross-sectional views illustrating a method of forming a package structure according to a first embodiment of the disclosure.

Referring to FIG. 1A, a carrier 10 is provided. The carrier 10 may be a glass carrier, a ceramic carrier, or the like. A release layer 11 is formed on the carrier 10 by, for example, a spin coating method. In some embodiments, the release layer 11 may be formed of a polymer-based material such as an Ultra-Violet (UV) glue, a Light-to-Heat Conversion (LTHC) material, an epoxy-based thermal-release material, or the like. The release layer 11 is decomposable under the heat of light to thereby release the carrier 10 from the overlying structures that will be formed in subsequent steps.

A dielectric layer 12 (or referred as a first dielectric layer) is formed on the release layer 11. The dielectric layer 12 may be a single layer structure or a multi-layer structure. In some embodiments, the material of the dielectric layer 12 includes an inorganic dielectric material, an organic dielectric material, or a combination thereof. The inorganic dielectric material includes a nitride such as silicon nitride, an oxide such as silicon oxide, an oxynitride such as silicon oxynitride, phosphosilicate glass (PSG), borosilicate glass (BSG), boron-doped phosphosilicate glass (BPSG), or the like, or a combination thereof. The organic dielectric material includes a polymer, which may be a photosensitive material such as polybenzoxazole (PBO), polyimide (PI), benzocyclobutene (BCB), ajinomoto buildup gilm (ABF), solder resist film (SR), or the like, or a combination thereof. The dielectric layer 12 is formed by a suitable fabrication technique such as spin-coating, lamination, deposition, or the like.

Still referring to FIG. 1A, a seed layer 13 is formed on the dielectric layer 12, for example, through physical vapor deposition (PVD). In some embodiments, physical vapor deposition includes sputtering deposition, vapor deposition, or any other suitable method. The seed layer 13 may be a metal seed layer including copper, aluminum, titanium, alloys thereof, or multi-layers thereof. In some embodiments, the seed layer 13 includes a first metal layer such as a titanium layer (not shown) and a second metal layer such as a copper layer (not shown) over the first metal layer. In some embodiments, such the seed layer 13 is a conformal layer. That is, the seed layer 13 has a substantially equal thickness extending along the region on which the seed layer 13 is formed.

Thereafter, a patterned mask layer 14 is formed on the seed layer 13. The patterned mask layer 14 has a plurality of openings 16, exposing a portion of the seed layer 13. The patterned mask layer 14 is, for instance, a photoresist. The patterned mask layer 14 is formed by, for instance, forming a photoresist layer on the seed layer 13 at first, and then performing exposure and development processes on the photoresist layer.

Still referring to FIG. 1A, a conductive layer 15 is formed on the seed layer 13 exposed by the openings 16 through, for example, electroplating, or electroless plating. The conductive layer 15 is formed of, for instance, copper or other suitable metals.

Referring to FIG. 1A and FIG. 1B, the patterned mask layer 14 is then removed by a dry strip, a wet strip or a combination thereof, for example, such that the seed layer 13 not covered by the conductive layer 15 is exposed. In some embodiments, the seed layer 13 not covered by the conductive layer 15 is then removed with the conductive layer 15 as a mask, so as to form a seed layer 13 a. In some embodiments, the seed layer 13 a may be used as a barrier layer or a glue layer of the conductive layer 15. The removal method includes an etching process, such as a dry etching, a wet etching or a combination thereof.

Referring to FIG. 1B, the seed layer 13 a and the conductive layer 15 form a redistribution line (RDL) layer 17. In some embodiments, the RDL layer 17 includes a plurality of conductive traces extending on the dielectric layer 12 connected to each other. In some other embodiments, the RDL layer 17 has a multi-layer structure and includes a plurality of vias and a plurality of conductive traces connected to each other. In some embodiments, the RDL layer 17 includes RDLs 17 a and RDLs 17 b. Specifically, the RDLs 17 a are located at the two sides of the RDLs 17 b. The number of the RDLs 17 a and RDLs 17 b may be adjusted according to the design of products. A plurality of gaps 18 and 18′ are existed between the RDLs 17 a and 17 b. In some embodiments, the gap 18 is existed between the adjacent two RDLs 17 a, and the width W0 of the gap 18 ranges from 40 μm to 500 μm. The gap 18′ is existed between the adjacent two RDLs 17 b or between the adjacent RDL 17 a and RDL 17 b. In some embodiments, the width of the gap 18′ is larger than the width W0 of the gap 18.

Still referring to FIG. 1B, a dielectric layer 19 (or referred as a second dielectric layer) is formed on the dielectric layer 12 and the RDL layer 17, and fills in the gap 18 and 18′, so as to cover the dielectric layer 12, the sidewalls 47 of the RDL layer 17 and the top surface 24 of the RDL layer 17. The dielectric layer 19 may be a single layer structure or a multi-layer structure. In some embodiments, the material of the dielectric layer 19 includes an inorganic dielectric material, an organic dielectric material, or a combination thereof. The inorganic dielectric material includes a nitride such as silicon nitride, an oxide such as silicon oxide, an oxynitride such as silicon oxynitride, phosphosilicate glass (PSG), borosilicate glass (BSG), boron-doped phosphosilicate glass (BPSG), or the like, or a combination thereof. The organic dielectric material includes a polymer, which may be a photosensitive material such as polybenzoxazole (PBO), polyimide (PI), benzocyclobutene (BCB), ajinomoto build-up film (ABF), solder resist film (SR), or the like, or a combination thereof. The material of the dielectric layer 19 and the material of the dielectric layer 12 may be the same or different. The dielectric layer 19 is formed by a suitable fabrication technique such as spin-coating, lamination, deposition, or the like. In some embodiments, the RDL layer 17 and the dielectric layer 19 form a RDL structure 21.

Referring to FIG. 1B and FIG. 1C, thereafter, a portion of the second dielectric layer 19 over the gap 18 and the dielectric layer 19 in the gap 18 are removed by, for example, exposure and development processes, laser drilling process, photolithography and etching processes, or a combination thereof, such that a plurality of recesses 20 are formed. The recess 20 penetrates through the RDL structure 21, and exposes a portion of the top surfaces 24 and sidewalls 47 of the two adjacent RDLs 17 a, and a portion of the top surface of the dielectric layer 12.

In some embodiments, the recess 20 includes a first recess 20 a and a second recess 20 b spatially communicated with each other. The first recess 20 a is located over the second recess 20 b, that is, the first recess 20 a and the second recess 20 b are overlapped. The width of the first recess 20 a is larger than the width of the second recess 20 b. The first recess 20 a is located over the two adjacent RDLs 17 a to expose a portion of the top surfaces 24 of the RDLs 17 a. The second recess 20 b is located between the two adjacent RDLs 17 a to expose the sidewalls 47 of the RDLs 17 a and the top surface of the dielectric layer 12.

In some embodiments, the recess 20 has a stepped shape, the cross-section shape of the recess 20 has a T-shape or a funnel-like shape, but the present disclosure is not limited thereto. The sidewall of the first recess 20 a (that is the sidewall of the dielectric layer 19) and the top surface 19 b of the dielectric layer 19 form a corner a. The angle of the corner a ranges from 100° to 140°.

Referring to FIG. 1C to FIG. 1D, a seed layer 22 is then formed on the RDL structure 21 and on the dielectric layer 12. The material and the forming method of the seed layer 22 is substantially the same as those of the seed layer 13 shown in FIG. 1A, which will not be described again. The seed layer 22 covers the top surface 19 b of the dielectric layer 19 and covers the bottom surface and sidewalls of the recesses 20. In some embodiments, the seed layer 22 is in contact with a portion of the top surfaces 24 and sidewalls 47 of the RDLs 17 a and a portion of the top surface of the dielectric layer 12. The bottom surface of the seed layer 22 is substantially level with the bottom surface of the seed layer 13 a of the RDLs 17 a.

Referring to FIG. 1D, a patterned mask layer 23 is formed on the seed layer 22. The patterned mask layer 23 has a plurality of openings 25. The opening 25 exposes the seed layer 22 located in the recesses 20 and the seed layer 22 covering the corner a of the dielectric layer 19.

Still referring to FIG. 1D, a plurality of conductive posts 26 are formed on the seed layer 22 exposed by the openings 25 of the patterned mask 23. The conductive post 26 is disposed in the recess 20 and protrudes from the top surface 19 b of the dielectric layer 19. The conductive post 26 may be a copper post or any other suitable metal post. The term “copper posts” refers to copper protrusions, copper through vias, thick copper pads, and/or copper-containing protrusions. Throughout the description, the term “copper” is intended to include substantially pure elemental copper, copper containing unavoidable impurities, and copper alloys containing minor amounts of elements such as tantalum, indium, tin, zinc, manganese, chromium, titanium, germanium, strontium, platinum, magnesium, aluminum, or zirconium, etc. The conductive post 26 is formed by electroplating, for example.

Referring to FIG. 1D and FIG. 1E, the patterned mask layer 23 is then removed, such that the seed layer 22 not covered by the conductive posts 26 is exposed. The seed layer 22 not covered by the conductive posts 26 is then removed with the conductive posts 26 as a mask, so as to form a seed layer 22 a. In some embodiments, the seed layer 22 a may be used as a barrier layer or a glue layer of the conductive post 26. The removal method includes an etching process, such as a day etching, a wet etching, or a combination thereof.

Referring to FIG. 1E, the seed layer 22 a and the overlying conductive posts 26 form a plurality of through integrated fan-out vias (TIVs) 27. The number of the TIVs 27 is not limited to that is shown in FIG. 1E, which may be adjusted according to the requirement. The TIV 27 is disposed in the recess 20, and protrudes from the top surface 19 b of the dielectric layer 19. The TIV 27 penetrates through the RDL structure 21 and contacts with the dielectric layer 12. In other words, the TIV 27 is engaged with the RDL structure 21. Further, the TIV 27 is in electrical contact with a portion of the top surfaces 24 and the sidewalls 47 of the two adjacent RDLs 17 a.

Still referring to FIG. 1E, in some embodiments, an end of the TIV 27 (that is, the bottom of the TIV 27) has a stepped shape and is engaged with the RDL structure 21. Specifically, the seed layer 22 a and an end of the conductive post 26 have stepped shapes. A portion of sidewalls and bottoms of the conductive post 26 is covered by the seed layer 22 a. Another end of the TIV 27, that is, another end of the conductive post 26 is flat. The TIV 27 includes, from bottom to top, a first embedded part 27 a, a second embedded part 27 b and a protruding part 27 c which are in electrical contact with each other. The first embedded part 27 a and the second embedded part 27 b are located in the recess 20. The protruding part 27 c is located over the RDL structure 21 to protrude from the top surface 19 b of the dielectric layer 19.

Specifically, the first embedded part 27 a is located between the two adjacent RDLs 17 a and in electrical contact with the sidewalls 47 of the RDLs 17 a. The top surface of the first embedded part 27 a is substantially level with the top surface 24 of the RDLs 17 a, the bottom surface of the first embedded part 27 a is substantially level with the bottom surface of the RDLs 17 a and in contact with the dielectric layer 12. The second embedded part 27 b is located on the first embedded part 27 a and on the two adjacent RDLs 17 a to be in electrical contact with a portion of the top surfaces 24 of the two adjacent RDLs 17 a. In some embodiments, the cross-section shape of the first embedded part 27 a is square or rectangle. The cross-section shape of the second embedded part 27 b is inverted trapezoid or rectangle. The overall cross-section shape of the first embedded part 27 a and the second embedded part 27 b has a T-shaped or a funnel-like shape. In some embodiments, the bottom width W2 of the second embedded part 27 b is equal to or larger than the top width W1 of the first embedded part 27 a, such that the bottom of the TIV has a stepped shape. In some exemplary embodiments, the bottom width W2 of the second embedded part 27 b ranges from 50 μm to 510 μm, the top width W1 of the first embedded part 37 a substantially equals to the width W0 of the gap 18 (shown in FIG. 1B) and ranges from 40 μm to 500 μm.

The protruding part 27 c is located on the second embedded part 27 b. In some embodiments, the protruding part 27 c covers the top surface of the second embedded part 27 b and a portion of the top surface 19 b of the dielectric layer 19, that is to say, the corner a of the dielectric layer 19 is covered by the TIV 27, but the disclosure is not limited thereto. In some other embodiments, the protruding part 27 c only covers the top surface of the second embedded part 27 b and does not cover the top surface 19 b of the dielectric layer 19 (not shown). In some embodiments, the cross-section shape of the protruding part 27 c is rectangle or trapezoid, but the disclosure is not limited thereto.

Referring to FIG. 1F, a die 34 is attached to the dielectric layer 19 though an adhesive film 28 such as a die attach film (DAF), and disposed between the TIVs 27. The die 34 includes a substrate 29, a plurality of pads 30, a passivation layer 31, a plurality of connectors 32 and a passivation layer 33. The pads 30 may be a part of an interconnection structure (not shown) and electrically connected to the integrated circuit devices (not shown) formed on the substrate 29. The passivation layer 31 is formed over the substrate 29 and covers a portion of the pads 30. A portion of the pads 30 is exposed by the passivation layer 31 and serves as an external connection of the die 34. The connectors 32 is formed on and electrically connected to the pads 30 not covered by the passivation layer 31. The connectors 32 include solder bumps, gold bumps, copper bumps, copper posts, or the like. The passivation layer 33 is formed over the passivation layer 31 and aside the connectors 32 to cover the sidewalls of the connectors 32. The passivation layer 31 and 33 respectively includes an insulating material such as silicon oxide, silicon nitride, polymer, or a combination thereof. In some embodiments, the top surface of the passivation layer 33 is substantially level with the top surface of the connectors 32.

In some embodiments, the die 34 is one of a plurality of dies cut apart from a wafer, for example. The die 34 may be an application-specific integrated circuit (ASIC) chip, an analog chip, a sensor chip, a wireless and radio frequency chip, a voltage regulator chip or a memory chips. The number of the die 34 shown in FIG. 1F is merely for illustration, and the disclosure is not limited thereto. In some embodiments, two or more dies 34 may be mounted onto the dielectric layer 19, and the two or more dies 34 may be the same types of dies or the different types of dies. In some other embodiments, a wafer (not shown) comprising a plurality of dies 34 arranged in an array is mounted onto the dielectric layer 19, and the die 34 is surrounded by the TIVs 27.

An encapsulant 35 is then formed over the carrier 10 to encapsulate the sidewalls of the die 34 and the protruding parts 27 c of the TIVs 27. In some embodiments, the encapsulant 35 includes a molding compound, a molding underfill, a resin such as epoxy, a combination thereof, or the like. In some other embodiments, the encapsulant 35 includes a photo-sensitive material such as PBO, polyimide, BCB, a combination thereof, or the like, which may be easily patterned by exposure and development processes. In alternative embodiments, the encapsulant 35 includes nitride such as silicon nitride, oxide such as silicon oxide, PSG, BSG, BPSG, a combination thereof, or the like. The encapsulant 35 is formed by forming an encapsulant material layer over the carrier 10 by a suitable fabrication technique such as spin-coating, lamination, deposition, or similar processes. The encapsulant material layer encapsulates the top surfaces and sidewalls of the die 34 and the protruding part 27 c of the TIVs 27. Thereafter, a grinding or polishing process is performed to remove a portion of the encapsulant material layer, such that the top surfaces of the connectors 32 and the TIVs 27 are exposed. In some embodiments, the top surfaces of the connectors 32, the TIVs 27 and the encapsulant 35 are substantially coplanar.

Referring to FIG. 1G, a first dielectric layer 36 is formed on the die 34 and the TIVs 27 and the encapsulant 35. The first dielectric layer 36 may be a single layer structure or a multi-layer structure. The first dielectric layer 36 has a plurality of openings 37, exposing a portion of the TIVs 27 and a portion of the connectors 32 of the die 34. The material of the first dielectric layer 36 is similar to that of the dielectric layer 12 and the dielectric layer 19. The first dielectric layer 36 is formed by forming a first dielectric material layer (not shown) at first to cover the die 34, the encapsulant 35 and the TIVs 27. Thereafter, a portion of the dielectric material layer on the TIVs 27 and on the connectors 32 is removed by, for example, exposure and development processes, a laser drilling process, photolithography and etching processes, or a combination thereof, such that the first dielectric layer 36 having the openings 37 is formed.

Still referring to FIG. 1G, a seed layer 38 is formed on the first dielectric layer 36, and fills into the openings 37 to cover the bottom surface and sidewalls of the openings 37. The seed layer 38 is in electrical contact with the TIVs 27 and the connectors 32 at the bottom of the openings 37. The material and the forming method of the seed layer 38 are similar to those of the seed layer 13 shown in FIG. 1A.

Referring to FIG. 1H, a patterned mask layer 39 is formed on the seed layer 38. The patterned mask layer 39 has a plurality of openings 40, exposing the seed layer 38 in the openings 37 and a portion of the seed layer 38 on the first dielectric layer 36. A conductive layer 41 is then formed on the seed layer 38 exposed by the openings 40. The conductive layer 41 fills into the openings 37 and protrudes from the top surface of the first dielectric layer 36, and covers a portion of the top surface of the first dielectric layer 36.

Referring to FIG. 1H and FIG. 1I, the patterned mask layer 39 is then removed, such that the seed layer 38 not covered by the conductive layer 41 is exposed. The seed layer 38 not covered by the conductive layer 41 is then removed with the conductive layer 41 as a mask, so as to form a seed layer 38 a. The removal method includes an etching process, such as a dry etching, a wet etching, or a combination thereof.

Referring to FIG. 1I, the seed layer 38 a and the conductive layer 41 form a RDL layer 42. In some embodiments, the RDL layer 42 is in contact with and electrically connected to the TIVs 27 and the connectors 32 of the die 34. In some embodiments, the RDL layer 42 includes a plurality of vias 42 a and a plurality of conductive traces 42 b. The vias 42 a penetrate through the first dielectric layer 36 to contact with the TIVs 27 and the connectors 32. The conductive traces 42 b extend on the first dielectric layer 36 and are connected to the vias 42 a. Thereafter, a second dielectric layer 43 is formed on the RDL layer 42, so as to cover the top surface and sidewalls of the RDL layer 42. The material and the forming method of the second dielectric layer 43 are similar to those of the dielectric layer 12, which will not be described again.

The first dielectric layer 36, the RDL layer 42 and the second dielectric layer 43 form a RDL structure 44. The number of the layers of the RDL layer 42 of the RDL structure 44 is not limited to that is shown in FIG. 1I, and may be adjusted according to the requirements. The RDL structure 44 may have one or more layers of RDL layer 42. In some embodiment in which the RDL structure 44 has more than one RDL layers 42, the RDL structure 44 includes a plurality of stacked dielectric layers 36 and 43 and RDL layers 42 (not shown). The method of forming the multilayer structure of the RDL structure 44 is, for instance, after the second dielectric layer 43 is formed, repeating the processes from FIG. 1G to FIG. 1I described above to form multi-layers of RDL layers 42.

Still referring to FIG. 1I, the RDL structure 44 is disposed at the front side of the die 34 (the side close to the connectors 32, that is, close to an active surface of the die 34), the RDL structure 21 is disposed at the back side (the opposite side of the front side) of the die 34. Therefore, in some embodiments, the RDL structure 21 is referred as the back side RDL structure, and the RDL structure 44 is referred as the front side RDL structure.

Referring to FIG. 1I and FIG. 1J, the structure formed in FIG. 1I is turned over, the release layer 11 is decomposed under the heat of light, and the carrier 10 is then released from the overlying structure thereof.

Still referring to FIG. 1J and FIG. 1K, a portion of the dielectric layer 12, a portion of the seed layer 13 a, and the seed layer 22 a at the top of the TIVs 27 are removed to form a plurality of openings 45 a. The opening 45 a penetrates through the dielectric layer 12 of the RDL structure 21 and the seed layer 13 a of the RDLs 17 a. Further, portions of the dielectric layer 12 on the RDLs 17 b and the underlying seed layer 13 a are removed to form a plurality of openings 45 b. The opening 45 b penetrates through the dielectric layer 12 and the seed layer 13 a of the RDLs 17 b. The removal method includes a laser drilling process, for example. A seed layer 13 b of the RDL layer 17 and a seed layer 22 b of the TIV 27 are remained. A portion of sidewalls of the conductive post 26 is covered by the seed layer 22 b. The conductive post 26 is separated from the dielectric layer 19 by the seed layer 22 b therebetween. The bottom of the opening 45 a exposes the seed layer 22 b and the conductive post 26 of the TIV 27 and a portion of the top surface of the conductive layer 15 of the RDLs 17 a, and the sidewalls of the opening 45 a expose the seed layer 13 b of the RDLs 17 a and the dielectric layer 12. The width of the opening 45 a may be adjusted, as long as at least a portion of the conductive post 26 is exposed by the bottom of the opening 45 a. The bottom of the opening 45 b exposes the conductive layer 15 of the RDL 17 b, and the sidewalls of the opening 45 b expose the dielectric layer 12 and the seed layer 13 b of the RDL 17 b. In some embodiments in which the seed layer 13 (shown in FIG. 1A) and the seed layer 22 (shown in FIG. 1D) are formed with a same thickness, the top surface of the conductive post 26 and the top surface of the seed layer 22 b are coplanar with the top surface (the surface in contact with the seed layer 13 b) of the conductive layer 15, but the disclosure is not limited thereto.

Referring to FIG. 1K and FIG. 1L, a plurality of connectors 46 a and 46 b are respectively formed on TIVs 27 and on the RDLs 17 b. The connectors 46 a and 46 b may be referred as conductive terminals. In some embodiments, the connectors 46 a and 46 b may cover a portion of a top surface of the dielectric layer 12. In some other embodiments, the connectors 46 a and 46 b may not cover the top surface of the dielectric layer 12. The connectors 46 a and 46 b may be simultaneously formed or successively formed. The connector 46 a fills into the opening 45 a and penetrates through the dielectric layer 12 and the seed layer 13 b of the RDLs 17 a. The bottom of the connector 46 a is in electrical contact with the conductive post 26 and the seed layer 22 b of the TIV 27, and the conductive layer 15 of the RDLs 17 a. The sidewalls of the connector 46 a are in contact with the seed layer 13 b of the RDLs 17 a and the dielectric layer 12. The connector 46 b fills into the opening 45 b so that the bottom of the connector 46 b is in electrical contact with the conductive layer 15 of the RDL 17 b, and the sidewalls of the connector 46 b are in contact with the seed layer 13 b of the RDL 17 b and the dielectric layer 12. The material of the connector 46 a and 46 b include copper, aluminum, lead-free alloys (e.g., gold, tin, silver, aluminum, or copper alloys) or lead alloys (e.g., lead-tin alloys). In some embodiments, the connectors 46 a and 46 b are respectively formed by a ball mounting process. In some other embodiments, a printing step may be performed to print a solder paste in the openings 45 a and 45 b, followed by reflowing the solder paste to form the connectors 46 a and 46 b. Alternatively, connectors 46 a and 46 b are formed by dropping solder balls in openings 45 a and 45 b and then a reflow process is performed. In some embodiments, an under-ball metallurgy (UBM) layer (not shown) is further formed before the connectors 46 a and 46 b are formed. The UBM layer fills into the openings 45 a and 45 b, and covers the bottom and sidewalls of the openings 45 a and 45 b and a portion of the dielectric layer 12.

Still referring to FIG. 1L, a package structure 50 a is thus completed. The package structure 50 a includes the die 34, the RDL structure 21, the TIVs 27, the RDL structure 44 and the connectors 46 a and 46 b. The TIVs 27 penetrates through the RDL structure 21 and are in electrical contact with the connectors 46 a. Thereafter, the package structure 50 a may be connected to other package components such as a printed circuit board (PCB), a flex PCB, or the like through the connectors 46 a and 46 b. In some embodiments in which a wafer comprising a plurality of dies 34 is formed over the carrier 10 in the forgoing process, before connecting to other package components, the package structure (not shown) may be singulated by a die-saw process to form a plurality of identical package structures 50 a as illustrated in FIG. 1L.

FIGS. 2A to 2C are schematic cross-sectional views illustrating a method of forming a package structure according to a second embodiment of the disclosure. The second embodiment differs from the first embodiment in that connectors 63 are further formed to connect to a RDL structure 144 over the die 34, and a package-on-package (POP) device is further formed. The details are described as below.

Referring to FIG. 1I and FIG. 2A, in some embodiments, the RDL structure 144 includes a plurality of RDL layers 42/61 and dielectric layers 36/43/60 stacked alternately, and the RDL layer 42 is referred as a first RDL layer 42. In some embodiments, after the first dielectric layer 36, the first RDL layer 42, and the second dielectric layer 43 are formed as shown in FIG. 1I, processes similar to those of FIG. 1G to FIG. 1I are performed, so as to form a second RDL layer 61 and a third dielectric layer 60. The second RDL layer 61 penetrates through the second dielectric layer 43 to connect to the first RDL layer 42. The material, forming method and structural characteristics of the second RDL layer 61 and the third dielectric layer 60 are similar to those of the first RDL layer 42 and the second dielectric layer 43, which will not be described again.

Thereafter, a conductive layer 62 penetrating though the third dielectric layer 60 is formed to connect to the second RDL layer 61. In some embodiments, the conductive layer 62 is referred as under-ball metallurgy (UBM). The material of the conductive layer 62 includes a metal or a metal alloy. The conductive layer 62 is, for example, copper, tin, an alloy thereof, or a combination thereof. The conductive layer 62 is formed by, for instance, physical vapor deposition or electroplating.

Still referring to FIG. 2A, a plurality of connectors (also referred to as conductive balls) 63 are placed on the conductive layer 62. The material of the connector 63 includes copper, aluminum, lead-free alloys (e.g., gold, tin, silver, aluminum, or copper alloys) or lead alloys (e.g., lead-tin alloys). In some embodiments, the connectors 63 are placed on the conductive layer 62 by a ball mounting process. The connectors 63 are electrically connected to the connectors 32 through the conductive layer 62 and the RDL structure 144.

Referring to FIG. 2A and FIG. 2B, processes similar to those of FIGS. 1J to 1L are then performed, the structure formed in FIG. 2A is turned over, the release layer 11 is decomposed, and the carrier 10 is then released from the overlying structure thereof.

Referring to FIG. 2B, a plurality of openings 45 a and 45 b are formed. Thereafter, a plurality of connectors 46 a penetrating through the dielectric layer 12 and the seed layer 13 b of the RDLs 17 a are formed to be in electrical contact with the TIVs 27 and the RDLs 17 a. A plurality of connectors 46 b penetrating through the dielectric layer 12 is formed to be in electrical contact with the RDLs 17 b. The connectors 46 a and 46 b may be simultaneously formed or successively formed. The forming method and the structural characteristics of the openings 45 a and 45 b and the connectors 46 a and 46 b are substantially the same as those in the first embodiment, which will not be described again.

The package structure 50 b is thus completed. In some embodiments, the package structure 50 b may further be electrically coupled to a package structure 70 to form a POP device, but the disclosure is not limited thereto.

Referring to FIG. 2C, in some embodiments, the package structure 70 has a substrate 71, and a die 72 is mounted on one surface (e.g. top surface) of the substrate 71. Bonding wires 73 are used to provide electrical connections between the die 72 and pads 74 (such as bonding pads) on the same top surface of the substrate 71. TIVs (not shown) may be used to provide electrical connections between the pads 74 and pads 75 (such as bonding pads) on an opposing surface (e.g. bottom surface) of the substrate 71. The connectors 46 a and 46 b connect the pads 75 and electrically connect to the package structure 50 b. An encapsulant 77 is formed over the components to protect the components from the environment and external contaminants.

Thereafter, an under-fill layer 48 is formed to fill the space between the package structure 50 b and the package structure 70 and to surround the connectors 46 a and 46 b. In some embodiments, the under-fill layer 48 includes a molding compound such as epoxy, and is formed using dispensing, injecting, and/or spraying techniques.

FIG. 3A to FIG. 3F are schematic cross-sectional views illustrating a method of forming a package structure according to some embodiments of the disclosure.

In the forgoing embodiments, as shown in FIG. 1L and FIG. 2B, the TIV 27 penetrates through the RDL structure 21 to be in electrical contact with the connector 46 a, and the TIV 27 and the connector 46 a are also in electric contact with the conductive layer 15 and the seed layer 13 b of the RDLs 17 a. Referring to FIG. 3A to FIG. 3F, in some embodiments, there may be some TIVs 127 that is not in contact with an RDL 117 a, but separated from the RDLs 117 a by the dielectric layer 19, and the connector 46 a is not in contact with the RDLs 117 a. For the sake of brevity, FIGS. 3A to 3E only show the RDLs 117 a, a TIV 127, the encapusulant 35 and a connector 146 a.

Referring to FIG. 1B, FIG. 3A and FIG. 3B, the RDL structure 21 further includes RDLs 117 a, and a gap 118 is existed between the adjacent two RDLs 117 a. A portion of the dielectric layer 19 within the gap 118 is removed, so as to form a recess 120 penetrating through the dielectric layer 19. The recess 120 is located between the adjacent two RDLs 117 a. In some embodiments, the bottom of the recess 120 exposes a portion of the top surface of the dielectric layer 12. As the dielectric layer 19 in the gap 118 is partially removed, such that the RDLs 117 a is not exposed in the recess 120. In some embodiments, the cross-section shape of the recess 120 is inverted trapezoid, square, rectangle, or any other shape, as long as the surfaces of the RDLs 117 a are covered by the dielectric layer 19. Thereafter, a seed layer 122 is formed on the dielectric layer 19.

Referring to FIGS. 3B to 3D, processes similar to those of FIGS. 1D to 1E are performed to form a TIV 127. The TIV 127 including a conductive post 126 and a seed layer 122 a. The material and the forming method are substantially the same as those of the TIV 27, which will not be described again. The TIV 127 penetrates through the RDL structure 21 and is in contact with the dielectric layer 12. The TIV 127 differs from the TIV 27 of the foregoing embodiments in that the TIV 127 is not in electrical contact with the RDLs 117 a, but separated from the RDLs 117 a by the dielectric layer 19. In some embodiments, the TIV 127 includes an embedded part 127 a and a protruding part 127 b. The embedded part 127 a is located in the recess 120, and the top surface of the embedded part 127 a is substantially level with the top surface 19 b of the dielectric layer 19. In some embodiments, the cross-section shape of the embedded part 127 a is inverted trapezoid, square or rectangle, but the disclosure is not limited thereto. In some embodiments in which the embedded part 127 a has an inverted trapezoid cross-section shape, the top width W12 of the embedded part 127 a is less than the width W11 of the gap 118 as shown in FIG. 3A. The protruding part 127 b is located on the embedded part 127 a and protrudes from the top surface 19 b of the dielectric layer 19. The other structural characteristics of the protruding part 127 b are similar to those of the TIV 27 as shown in FIG. 1E.

Referring to FIG. 1J, FIG. 3D and FIG. 3E, after the carrier 10 is released, a portion of the dielectric layer 12, and the seed layer 122 a covering the top surface of the conductive post 126 are removed, so as to form an opening 145 a penetrating through the dielectric layer 12, and a seed layer 122 b of the TIV 127 is remained. A portion of sidewalls of the embedded part 127 a is covered by the seed layer 122 b, and the top surface of the embedded part 127 a is exposed by the opening 145 a. The width of the opening 145 a may be adjusted, as long as at least a portion of the conductive post 126 is exposed by the bottom of the opening 145 a.

The conductive post 126 is separated from the dielectric layer 19 by the seed layer 122 b therebetween. In some embodiments, the cross-section shape of the seed layer 122 b is L shaped or line-shaped, but the disclosure is not limited thereto.

In some embodiments, the cross-section shape of the opening 145 a is inverted trapezoid or rectangle, for example, but the disclosure is not limited thereto. The bottom of the opening 145 a exposes the conductive post 126 and the seed layer 122 b of the TIV 127. In some embodiments, the top surface of the conductive post 126 and the top surface of the seed layer 122 b are substantially coplanar with the conductive layer 15 of the RDLs 117 a. Referring to FIG. 3F, a connector 146 a is formed on the TIV 127. The connector 146 a may be referred as a conductive terminal. The connector 146 a penetrates through the dielectric layer 12, and the bottom of the connector 146 a is in electrical contact with the conductive post 126 and the seed layer 122 b of the TIV 127. The connector 146 a and the RDLs 117 a are separated by the dielectric layer 19 therebetween.

In some embodiments of the present disclosure, the TIV is provided to penetrate through the RDL structure to be in contact with and electrically connected to the connector, thus the open issue between the TIV and the RDL structure that caused by the seed layer or barrier layer or glue layer is avoided. On the other hand, as the seed layer is partially removed, a portion of the seed layer is still disposed between the conductive post of the TIV and the dielectric layer, thus the delamination problem is also avoided.

In accordance with some embodiments of the disclosure, a package structure includes a die, a RDL structure, a TIV and a first connector is provided. The RDL structure is connected to the die and includes a plurality of RDLs. The TIV is aside the die and penetrates through the RDL structure. The first connector is in electrical contact with the TIV and electrically connected to the die. The TIV is in electrical contact with the RDLs of the RDL structure.

In accordance with alternative embodiments of the disclosure, a package structure includes a die, a RDL structure, a TIV and a connector is provided. The RDL structure is connected to the die. The TIV is aside the die and penetrates through the RDL structure. The connector is in electrical contact with the TIV and electrically connected to the die.

In accordance with some embodiments of the disclosure, a method of manufacturing a package structure is provided. The method is described as below. A RDL structure is formed on a first dielectric layer. A die is attached on the RDL structure. A TIV is formed aside the die and penetrating through the RDL structure. A connector is formed to be in electrical contact with the TIV.

The foregoing outlines features of several embodiments so that those skilled in the art may better understand the aspects of the disclosure. Those skilled in the art should appreciate that they may readily use the disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the same advantages of the embodiments introduced herein. Those skilled in the art should also realize that such equivalent constructions do not depart from the spirit and scope of the disclosure, and that they may make various changes, substitutions, and alterations herein without departing from the spirit and scope of the disclosure. 

What is claimed is:
 1. A package structure, comprising: a die; an encapsulant laterally encapsulating the die; a first redistribution line (RDL) structure on a first side of the die and the encapsulant, wherein the first RDL structure comprises a dielectric layer and a redistribution layer in the dielectric layer; a second RDL structure on a second side of the die and the encapsulant; a conductive terminal connected to the redistribution layer; and a through via extending through the encapsulant and the redistribution layer to contact the conductive terminal and the second RDL structure.
 2. The package of claim 1, wherein the through via contact a bottom surface and a sidewall of the redistribution layer.
 3. The package of claim 1, wherein the through via contact a top surface of the redistribution layer.
 4. The package of claim 1, wherein a sidewall of the through via in the first redistribution line (RDL) structure has a stepped shape.
 5. The package of claim 1, wherein the through via comprising: a first part, in the encapsulant; a second part, in the dielectric layer; and a third part, in the redistribution layer, wherein the second part is between the first part and the third part, and a width of the first part is larger than a width of the second part, and the width of the second part is larger than the third part, wherein a portion of the dielectric layer is vertically sandwiched between the redistribution layer and the through via.
 6. The package of claim 5, wherein the through via comprises: a seed layer; and a conductive post on the seed layer.
 7. The package of claim 6, wherein the seed layer is sandwiched between the redistribution layer and the conductive post, and the dielectric layer and the conductive post.
 8. The package of claim 6, wherein the seed layer covers a corner of the redistribution layer.
 9. The package of claim 6, wherein the conductive post is in contact with the conductive terminal.
 10. The package of claim 1, wherein a connector of the die is in contact with the second RDL structure.
 11. The package, comprising: a through via comprising a conductive post and a seed layer covering a portion of the conductive post; the conductive post, comprising: a first part over the seed layer; a second part, wherein the seed layer is laterally around the second part and under the second part; and a third part, wherein the seed layer is laterally around the third part, wherein the second part is between the first part and the third part, and a width of the first part is larger than a width of the second part, and the width of the second part is larger than the third part.
 12. The package of claim 11, further comprising: an encapsulant encapsulating the first part; a redistribution layer laterally around and in contact with the third part; and a dielectric layer, vertically between the redistribution layer and the encapsulant, and laterally around the second part.
 13. The package of claim 12, wherein the seed layer, vertically sandwiched between the first part and the dielectric layer, laterally sandwiched between the second part and the dielectric layer, and laterally sandwiched between the third part and the redistribution layer.
 14. The package of claim 13, wherein a sidewall of the first part is in contact with the encapsulant.
 15. The package of claim 11, further comprising: a redistribution line (RDL) structure connected to the first part, wherein the encapsulant vertically sandwiched between the dielectric layer and the RDL structure.
 16. A method of manufacturing a package structure, comprising: forming a first redistribution line (RDL) structure, wherein the first RDL structure comprising a redistribution layer and a dielectric layer on the redistribution layer; attaching a die on the first RDL structure; patterning the dielectric layer and the redistribution layer to form a recess, wherein the redistribution layer is cut to form a first part and a second part, and the first part and a second part are separated by the recess; forming a through via aside the die and in the recess to be in contact with the first part and the second part; and forming a connector to be in contact with the through via, the first part and the second part.
 17. The method of claim 16, wherein the recess is formed to have a stepped shape.
 18. The method of claim 16, wherein the forming the through via comprises: forming a seed layer and a conductive post on the seed layer, and removing a portion of the seed layer, such that the connector contacts the conductive post and the seed layer.
 19. The method of claim 16, wherein the forming the through via comprises: forming a seed material on the dielectric layer, and filling in the recess; forming a patterned mask layer on a first portion of the seed material, wherein the patterned mask layer has an opening exposing a second portion of the seed material; forming a conductive post in the opening; removing the patterned mask layer; and remove the first portion of the seed material.
 20. The method of claim 18, further comprising: forming a second RDL structure to be in contact the conductive post. 